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All-in-One Report Demo (NSN: 6625013803727, Part Number: NOPN6625013803727)
Master Cross Reference Data (MCRD) - alternate part numbers for national stock numbers
NSN
Description
MCRL Information
 
6625013803727

NO ITEM NAME AVAILABLE

INC:
HMIC: P
ESDC:
ENAC:
Cancelled By:
Part # MCRL
Information
CAGE Code
Phone
Fax
Company Name
Address
NO PN - 6625013803727 Details Available
Details Available
Details Available
Details Available
Details Available
R-4000A RNVC: 2
RNCC: 3
DAC: 4
Details Available
Details Available
Details Available
Details Available
Details Available
R-4000A RNVC: 9
RNCC: 3
DAC: 4
Details Available
Details Available
Details Available
Details Available
Details Available
 
 
DRMS - Government Auction History - (NSN : 6625013803727)
 
Description
Event #
Lot #
Location Total Bid QTY
#Items in Lot
Condition
Acquisition
Price
Lot Title
TEST SETSEMICONDUC
Event: 1152
Lot: 6123
Fort Hood/Killeen TX Details Available Qty: 1
Items: 4
A4
Details Available
LOT (4) EACH TEST EQUIPMENT, SUCH AS: RADIO FREQUENCY AMPLIFLER, DECADE CAPACITOR, DECADE RESISTOR.
TEST SETSEMICONDUC
Event: 1682
Lot: 8531
Barstow CA Details Available Qty: 1
Items: 5
D7
Details Available
LOT (5) ELECTROCNICS TO INCLUDE, PERKIN-ELMER DIFFERENTIAL CORRECTED SPECTRA UNIT PRECISION CURRENT SOURCE MODEL 65, OPTRONIC LAB INC. SEMICONDUCTOR TEST SET MODEL MAY-DAY S 150VA, B10-AAD COATING SYSTEM, POLARON DIVISION CARBON EVAPORATION POWER SUPPLY AND AZIMUTH POSITIONER CONTROL UNIT SERIES 4100, SCIENTIFIC ATLANTA INC.
TEST SETSEMICONDUC
Event: 1758
Lot: 1707
Fort Stewart GA Details Available Qty: 1
Items: 5
H7
Details Available
LOT (7)(1)FLUKE, DIGITAL MULTIMETER MDL:8050A. (1)MOTOROLA, MASTERTECH SEMICONDUCTOR TEST SET MDL: R-4000A. (2)PICTURETEL PHONE WITH CAMERA MDL: SPH-1. (2)FLUKE 27 MULTIMETER. (1)ELECTRONIC CIRC TEST SET. ITEM MUST BE REMOVED WITHIN TWO WEEKS OF PAID INVOICE.
TEST SETSEMICONDUC
Event: 1825
Lot: 1758
Fort Stewart GA Details Available Qty: 1
Items: 6
H7
Details Available
LOT APPROX (21)TESTING ELECTRONIC COMPONENTS INCLUDING: MOTOROLA TEST SET SEMICONDUCTOR, GUN ELECTRICAL CIRCUIT TEST, TEST SET STROBE, FLUKE 27 MULTIMETERS, FLUKE 8050 DIGITAL MULTIMETER, CASE ELECTRONIC COMPONENTS.
TEST SETSEMICONDUC
Event: 1866
Lot: 1729
Fort Stewart GA Details Available Qty: 1
Items: 8
H7
Details Available
LOT (1)PLT OF ELECTRONIC EQUIPMENT THAT INCLUDES:HP 4935A TRANSMISSION TEST SET, JOINT ELECTRONICS CASE ELECTRONIC, FLUKE 8050A DIGITAL MULTIMETER, MOTOROLA TEST SET SEMICONDUCTOR DEVICE, TEST SET CIRCUIT GUN, JOINT ELECTRONICS TEST SET RADIO FREQ AND MORE.
TEST SETSEMICONDUC
Event: 2645
Lot: 1530
Jacksonville FL Details Available Qty: 1
Items: 3
B4
Details Available
LOT (3) TEST EQUIPMENT INCLUDING: MOTOROLA TEST SET SEMICONDUCTOR, BOONTON RF MILLIVOLTMETER, FLUKE 77BN MULTIMETER.
TEST SETSEMICONDUC
Event: 5747
Lot: 56
Lockbourne OH Details Available Qty: 1
Items: 4
F7
Details Available
LOT (0056)
TEST SETSEMICONDUC
Event: 5808
Lot: 54
Lockbourne OH Details Available Qty: 1
Items: 4
F7
Details Available
26 ea, include test lead set, test adapter, voice data test box
 
 
Management Data - US Gov't supply management data (costs, storage, etc.)
  NSN
Item Name
Management Data  
  6625-013803727

NO ITEM NAME AVAILABLE
PMIC Criticality ADPE ESDC HMIC DEML
A X 0 P A
S / A SOS AAC QUP UI Unit
Price
SLC CIIC Rep
Code
Mgmt
Ctrl
Phrase
Data
Details Available