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All-in-One Report Demo (NSN: 6625001885851, Part Number: R16ANTS286U)
Master Cross Reference Data (MCRD) - alternate part numbers for national stock numbers
NSN
Description
MCRL Information
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6625001885851
TEST SET,SEMICONDUCTOR DEVICE
INC: 25006
HMIC: P
ESDC:
ENAC:
Cancelled By: |
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DRMS - Government Auction History - (NSN : 6625001885851)
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Description
Event #
Lot #
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Location |
Total Bid |
QTY
#Items in Lot
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Condition
Acquisition
Price
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Lot Title
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TEST SETSEMICONDUC
Event: 1349
Lot: 405
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Norfolk VA |
Details Available
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Qty: 2
Items: 62
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B4
Details Available
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LOT (1) TRI-WALL ELECTRICAL SUPPLIES TO INCLUDE:EVENT CONTROLLER, ADAPTER TEST, SIGNAL MODULATOR, WAVE METER, COUPLER TEST SET, TEST FIXTURE, LEAD TEST, RECORDER DIGITAL DATA, TEST SET ELECTRONIC
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TEST SETSEMICONDUC
Event: 1349
Lot: 405
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Norfolk VA |
Details Available
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Qty: 2
Items: 62
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A1
Details Available
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LOT (1) TRI-WALL ELECTRICAL SUPPLIES TO INCLUDE:EVENT CONTROLLER, ADAPTER TEST, SIGNAL MODULATOR, WAVE METER, COUPLER TEST SET, TEST FIXTURE, LEAD TEST, RECORDER DIGITAL DATA, TEST SET ELECTRONIC
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TEST SETSEMICONDUC
Event: 1682
Lot: 588
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Redstone Arsenal AL |
Details Available
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Qty: 1
Items: 28
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A1
Details Available
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LOT (33) TEST SETS TO INCLUDE: (1) BENDIX MDL:60B4-1A INSULATION (1) PHOENIX MICROSYSTEMS INC. MDL:1500A COMIT (2) CXR TELECOM CORP. MDL:704A201 (1) SIGMA INSTRUMENTS MDL:4500 RELAY (1) SENCORE MDL:TF46 TRANSISTOR/ FET & (1) VU-DATA CORP. MDL:3110 IN-CIRCUIT COMPONENT
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TEST SETSEMICONDUC
Event: 2571
Lot: 522
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Redstone Arsenal AL |
Details Available
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Qty: 1
Items: 11
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A1
Details Available
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LOT (16) TEST SETS TO INCLUDE: (2) SENCORE, PN:TF46 (1) NAVAL SEA SYSTEMS COMMAND, PN:6097462-002 (1) MOOG ACFT GROUP, PN:153000-100 (1) GENRAD INC, PN:2225-4008-C (1) JAIDINGER MFG CO, PN:Y (1) JOINT ELECTRONICS, PN:TS268U (1) BAE SYSTEMS CONTROLS INC, PN:9892115G1 (1) AGILENT TECHNOLOGIES, PN:8743A (1) BOEING, PN:F71365 & (5) JOINT ELECTRONICS, PN:TTU27E
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Technical Characteristics - detailed information such as measurements and material type for national stock numbers
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NSN
Item Name |
Technical Characteristics |
6625-001885851
TEST SET,SEMICONDUCTOR DEVICE |
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Management Data - US Gov't supply management data (costs, storage, etc.)
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NSN
Item Name |
Management Data |
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6625-001885851
TEST SET,SEMICONDUCTOR DEVICE
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| PMIC |
Criticality |
ADPE |
ESDC |
HMIC |
DEML |
| A |
X |
0 |
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P |
A |
| S / A |
SOS |
AAC |
QUP |
UI |
Unit
Price |
SLC |
CIIC |
Rep
Code |
Mgmt
Ctrl |
Phrase
Data |
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